Inventors:
James Stewart - San Jose CA, US
Anthony Ho - Richmond CA, US
Rudolf Hofmeister - Sunnyvale CA, US
Darin Douma - Monrovia CA, US
Stephen Hosking - Santa Cruz CA, US
Andreas Weber - Los Altos CA, US
Jeffrey Price - Sunnyvale CA, US
International Classification:
H01J040/14
Abstract:
Methods and processes are disclosed for calibrating optoelectronic devices, such as optoelectronic transceivers and optoelectronic receivers, based upon a measured avalanche photodiode bit error rate. In general, the method involves measuring a bit error rate for the avalanche photodiode and adjusting the reverse bias voltage of the avalanche photodiode until the bit error rate is minimized. This process is repeated for each of a variety of different thermal conditions. Information concerning each thermal condition and the corresponding reverse bias voltage is stored in a memory of the optoelectronic device.