MRS. ANH THU NGO, MSPT
Physical Therapy at Petersen Ave, San Jose, CA

License number

California PT 19280

Personal information

See more information about ANH THU NGO at radaris.com

Name

Address

Phone

Anh Ngo

5026 Anaheim Loop, Union City, CA 94587

Anh Ngo

503 Sebasian Way, San Jose, CA 95111

Anh Ngo, age 75

4650 Cogswell Rd, El Monte, CA 91732

(626) 222-8500

Anh Ngo

4336 Richwood Ave, El Monte, CA 91732

Anh Ngo

5102 W 16Th St, Santa Ana, CA 92703

(714) 615-5774

Professional information

See more information about ANH THU NGO at trustoria.com

Associate Consultant At Lunexa

Position:

Associate Consultant at Lunexa

Location:

San Francisco Bay Area

Industry:

Computer Software

Work:

Lunexa since Apr 2012 - Associate Consultant Baynote Inc. - San Jose, CA Mar 2011 - Apr 2012 - Software Engineer Tower Foundation, San Jose State University Sep 2010 - Dec 2010 - Research Assistant Marvell Semiconductor Inc. Sep 2010 - Dec 2010 - IT Consultant San José State University 2010 Jun 2010 - Sep 2010 - Research Assistant

Education:

San Jose State University 2008 - 2010
B.S, Computer Science Mission College 2006 - 2008

Skills:

Java, JavaScript, Linux, XML, MySQL, PHP, JSON, CSS, jQuery, HTML, AJAX, REST, Servlets, UML, Facebook API, Hadoop, HBase, Microstrategy, Perl

Languages:

Vietnamese

Electrical Engineer

Location:

San Jose, California

Industry:

Electrical/Electronic Manufacturing

Work:

-- 2000 - 2013 - Test Engineer FPT Corp. - Vietnam 1993 - 2000 - Manager of Customer Service Department Electromechanical Corp. - Vietnam 1988 - 1993 - Manufacturing Engineer

Education:

San Jose State University
B.S., Electrical Engineering University of Natural Sciences, Vietnam
B.S., Physics

Skills:

Semiconductors, Solar Energy, Manufacturing, System Testing, Design of Experiments, Development Testing, Testing Process, Process Analysis, Failure Analysis, Power Distribution

Languages:

English, Vietnamese

Awards:

Dean's Scholar
SJSU

Anh Thu Ngo, San Jose CA - MSPT

Specialties:

Physical Therapy

Address:

1601 Petersen Ave, San Jose 95129
(408) 253-7502 (Phone)

Languages:

English

Non-Contact Technique For Using An Eddy Current Probe For Measuring The Thickness Of Metal Layers Disposed On Semi-Conductor Wafer Products

US Patent:

6407546, Jun 18, 2002

Filed:

Apr 7, 2000

Appl. No.:

09/545119

Inventors:

Cuong Duy Le - Gilroy CA 95020
Anh The Ngo - San Jose CA 95132

International Classification:

G01B 706

US Classification:

324230, 324202, 324226, 324716, 324 711

Abstract:

A method and system for identifying thicknesses of inspection samples, such as semiconductor wafers is presented. The method and system includes a probe housing, comprising an eddy current sense coil and a linear motion controller, and a computer that controls the linear motion controller and the eddy current sense coil. The computer may be configured to identify a thickness of the inspection sample by a method comprising the generation of a natural intercepting curve based on resistance and reactance measurements of at least two data points. Then, a plurality of corresponding resistance and reactance measurements of a location on the inspection sample is obtained with the eddy current sensor, where the eddy current sensor makes a first measurement at a first distance from the inspection sample, and makes each of the remaining plurality of measurements at a distance that is incrementally further away from the inspection surface. Next, an inspection sample curve is generated based on the plurality of corresponding resistance and reactance measurements obtained from the inspection sample. An intersection point between the natural intercepting curve and the inspection sample curve is also generated.