ANDREI VASILIEVICH TKACHUK
Pilots at Glengarry Ln, Walnut Creek, CA
License number
California A5162247
Issued Date
Dec 2015
Expiration Date
Dec 2017
Category
Airmen
Type
Authorized Aircraft Instructor
Address
Address
1108 Glengarry Ln, Walnut Creek, CA 94596
Professional information
Process For Examining Mineral Samples With X-Ray Microscope And Projection Systems
US Patent:
8068579, Nov 29, 2011
Filed:
Apr 9, 2009
Appl. No.:
12/421380
Inventors:
Wenbing Yun - Walnut Creek CA, US
Michael Feser - Walnut Creek CA, US
Andrei Tkachuk - Walnut Creek CA, US
Thomas A. Case - Walnut Creek CA, US
Frederick W. Duewer - Albany CA, US
Hauyee Chang - Berkeley CA, US
Michael Feser - Walnut Creek CA, US
Andrei Tkachuk - Walnut Creek CA, US
Thomas A. Case - Walnut Creek CA, US
Frederick W. Duewer - Albany CA, US
Hauyee Chang - Berkeley CA, US
Assignee:
Xradia, Inc. - Pleasanton CA
International Classification:
G01N 23/00
US Classification:
378 21, 378 4
Abstract:
A process to determine the porosity and/or mineral content of mineral samples with an x-ray CT system is described. Based on the direct-projection techniques that use a spatially-resolved x-ray detector to record the x-ray radiation passing through the sample, 1 micrometer or better resolution is achievable. Furthermore, by using an x-ray objective lens to magnify the x-ray image in a microscope configuration, a higher resolution of up to 50 nanometers or more is achieved with state-of-the-art technology. These x-ray CT techniques directly obtain the 3D structure of the sample with no modifications to the sample being necessary. Furthermore, fluid or gas flow experiments can often be conducted during data acquisition so that one may perform live monitoring of the physical process in 3D.
Structured Anode X-Ray Source For X-Ray Microscopy
US Patent:
7443953, Oct 28, 2008
Filed:
Dec 11, 2006
Appl. No.:
11/609266
Inventors:
Wenbing Yun - Walnut Creek CA, US
Frederick W. Duewer - Albany CA, US
Michael Feser - Martinez CA, US
Andrei Tkachuk - Walnut Creek CA, US
Srivatsan Seshadri - Walnut Creek CA, US
Frederick W. Duewer - Albany CA, US
Michael Feser - Martinez CA, US
Andrei Tkachuk - Walnut Creek CA, US
Srivatsan Seshadri - Walnut Creek CA, US
Assignee:
Xradia, Inc. - Concord CA
International Classification:
G21K 5/04
US Classification:
378 84, 378156
Abstract:
An x-ray source comprises a structured anode that has a thin top layer made of the desired target material and a thick bottom layer made of low atomic number and low density materials with good thermal properties. In one example, the anode comprises a layer of copper with an optimal thickness deposited on a layer of beryllium or diamond substrate. This structured target design allows for the use of efficient high energy electrons for generation of characteristic x-rays per unit energy deposited in the top layer and the use of the bottom layer as a thermal sink. This anode design can be applied to substantially increase the brightness of stationary, rotating anode or other electron bombardment-based sources where brightness is defined as number of x-rays per unit area and unit solid angle emitted by a source and is a key figure of merit parameter for a source.
Mechanism For Switching Sources In X-Ray Microscope
US Patent:
7796725, Sep 14, 2010
Filed:
Mar 11, 2009
Appl. No.:
12/401750
Inventors:
Ziyu Wu - Beijing, CN
Wenbing Yun - Walnut Creek CA, US
Peiping Zhu - Beijing, CN
Yuxin Wang - Northbrook IL, US
Qingxi Yuan - Beijing, CN
Andrei Tkachuk - Walnut Creek CA, US
Wanxia Huang - Beijing, CN
Michael Feser - Walnut Creek CA, US
Wenbing Yun - Walnut Creek CA, US
Peiping Zhu - Beijing, CN
Yuxin Wang - Northbrook IL, US
Qingxi Yuan - Beijing, CN
Andrei Tkachuk - Walnut Creek CA, US
Wanxia Huang - Beijing, CN
Michael Feser - Walnut Creek CA, US
Assignee:
Xradia, Inc. - Concord CA
International Classification:
G21K 7/00
US Classification:
378 43
Abstract:
An x-ray imaging system uses a synchrotron radiation beam to acquire x-ray images and at least one integrated x-ray source. The system has an imaging system including sample stage controlled by linear translation stages, objective x-ray lens, and x-ray sensitive detector system, placed on a fixed optical table and a mechanical translation stage system to switch x-ray sources when synchrotron radiation beam is not available.
X-Ray Microscope With Switchable X-Ray Source
US Patent:
7813475, Oct 12, 2010
Filed:
Mar 11, 2009
Appl. No.:
12/401740
Inventors:
Ziyu Wu - Beijing, CN
Wenbing Yun - Walnut Creek CA, US
Peiping Zhu - Beijing, CN
Yuxin Wang - Northbrook IL, US
Qingxi Yuan - Beijing, CN
Andrei Tkachuk - Walnut Creek CA, US
Wanxia Huang - Beijing, CN
Michael Feser - Walnut Creek CA, US
Wenbing Yun - Walnut Creek CA, US
Peiping Zhu - Beijing, CN
Yuxin Wang - Northbrook IL, US
Qingxi Yuan - Beijing, CN
Andrei Tkachuk - Walnut Creek CA, US
Wanxia Huang - Beijing, CN
Michael Feser - Walnut Creek CA, US
Assignee:
Xradia, Inc. - Concord CA
International Classification:
G01N 23/04
US Classification:
378 62
Abstract:
An x-ray imaging system uses a synchrotron radiation beam to acquire x-ray images and at least one integrated x-ray source. The system has an imaging system including sample stage controlled by linear translation stages, objective x-ray lens, and x-ray sensitive detector system, placed on a fixed optical table and a mechanical translation stage system to switch x-ray sources when synchrotron radiation beam is not available.