Inventors:
James Saloio, JR. - Ludlow MA, US
An Nguyen - East Hartford CT, US
Assignee:
HAMILTON SUNDSTRAND CORPORATION - Windsor Locks CT
International Classification:
G01R 31/02
Abstract:
A system for testing over-current fault detection includes a first switch to connect a voltage to a load, a capacitor connected between the first switch and ground, a monitor circuit that monitors a current from the first switch to the load, and a microcontroller configured to detect an over-current fault condition based upon input from the monitor circuit. The microcontroller controls the state of the first switch to connect voltage to the load and verifies over-current detection based upon current generated during charging of the capacitor.