Inventors:
William Archibald - Foster City CA, US
Alfred Archibald - Hillsborough CA, US
International Classification:
G01N021/51, G01N021/03
US Classification:
422/082050, 702/025000, 702/028000, 438/689000
Abstract:
Rapid spectrum assay of multiple samples with infrared light is made possible by devices and methods that increase total light throughput. Multiple wavelength scan with Fourier analysis is combined with large numbers of sample wells located within infrared light compatible solid materials. In particular, very large scale measurement devices and systems for their use are fabricated from lithography and other techniques used for semiconductor processing.