ALEXANDER FRED NEUMANN
Pilots at Central Ave, Albuquerque, NM
License number
New Mexico A3674025
Issued Date
Jan 2017
Expiration Date
Jul 2017
Category
Airmen
Type
Authorized Aircraft Instructor
Address
Address
400 Central Ave SE APT 302, Albuquerque, NM 87102
Personal information
See more information about ALEXANDER FRED NEUMANN at radaris.comName
Address
Phone
3059 Dona Juanita Dr SW, Albuquerque, NM 87121
3803 Driftwood Ave, Alamogordo, NM 88310
524 Garcia St, Santa Fe, NM 87505
Alamogordo, NM
3813 Driftwood Ave, Alamogordo, NM 88310
Professional information
Alexander Neumann - Albuquerque, NM
Work:
Lockheed Martin
Instructor USAF - Okinawa, Japan
Chief Pilot / Assistant Director of Operations USAF - Albuquerque, NM
Chief / Flight Standards Pilot USAF - Fayetteville, NC
Chief Pilot / Assistant Director of Operations Air Command and Staff College - Maxwell AFB, AL
Student USAF - Fort Walton Beach, FL
Instructor / Evaluator Pilot / Chief of Training
Instructor USAF - Okinawa, Japan
Chief Pilot / Assistant Director of Operations USAF - Albuquerque, NM
Chief / Flight Standards Pilot USAF - Fayetteville, NC
Chief Pilot / Assistant Director of Operations Air Command and Staff College - Maxwell AFB, AL
Student USAF - Fort Walton Beach, FL
Instructor / Evaluator Pilot / Chief of Training
Education:
Air Command and Staff College - Maxwell AFB, AL
Master's in Military Science University of Washington - Seattle, WA
Bachelor's in Economics
Master's in Military Science University of Washington - Seattle, WA
Bachelor's in Economics
Structural Illumination And Evanescent Coupling For The Extension Of Imaging Interferometric Microscopy
US Patent:
8115992, Feb 14, 2012
Filed:
Dec 31, 2008
Appl. No.:
12/347619
Inventors:
Steven R. J. Brueck - Albuquerque NM, US
Yulia Kuznetsova - Albuquerque NM, US
Alexander Neumann - Albuquerque NM, US
Yulia Kuznetsova - Albuquerque NM, US
Alexander Neumann - Albuquerque NM, US
Assignee:
STC.UNM - Alburquerque NM
International Classification:
G02B 21/06, G02B 21/00
US Classification:
359385, 359368
Abstract:
In accordance with the invention, there are imaging interferometric microscopes and methods for imaging interferometric microscopy using structural illumination and evanescent coupling for the extension of imaging interferometric microscopy. Furthermore, there are coherent anti-Stokes Raman (CARS) microscopes and methods for coherent anti-Stokes Raman (CARS) microscopy, wherein imaging interferometric microscopy techniques are applied to get material dependent spectroscopic information.
Fabrication Of Enclosed Nanochannels Using Silica Nanoparticles
US Patent:
2013019, Aug 1, 2013
Filed:
Mar 14, 2013
Appl. No.:
13/831537
Inventors:
Steven R.J. Brueck - Albuquerque NM, US
Deying Xia - Belmont MA, US
Yuliya Kuznetsova - Albuquerque NM, US
Alexander Neumann - Albuquerque NM, US
Deying Xia - Belmont MA, US
Yuliya Kuznetsova - Albuquerque NM, US
Alexander Neumann - Albuquerque NM, US
Assignee:
STC.UNM - Albuquerque NM
International Classification:
B01D 69/04, G03F 7/20
US Classification:
21050023, 430324
Abstract:
In accordance with the invention, there is a method of forming a nanochannel including depositing a photosensitive film stack over a substrate and forming a pattern on the film stack using interferometric lithography. The method can further include depositing a plurality of silica nanoparticles to form a structure over the pattern and removing the pattern while retaining the structure formed by the plurality of silica nanoparticles, wherein the structure comprises an enclosed nanochannel.
Structural Illumination And Evanescent Coupling For The Extension Of Imaging Interferometric Microscopy
US Patent:
2013009, Apr 18, 2013
Filed:
Sep 27, 2012
Appl. No.:
13/629598
Inventors:
Steven R.J. Brueck - Albuquerque NM, US
Alexander Neumann - Albuquerque NM, US
Yuliya Kuznetsova - Albuquerque NM, US
Alexander Neumann - Albuquerque NM, US
Yuliya Kuznetsova - Albuquerque NM, US
Assignee:
STC.UNM - ALBUQUERQUE NM
International Classification:
G02B 21/06
US Classification:
359385
Abstract:
In accordance with the aspects of the present disclosure, a method and apparatus is disclosed for imaging interferometric microscopy (IIM), which can use an immersion medium to enhance resolution up to a resolution of linear systems resolution limit of λ/4n, where λ is the wavelength in free space and n is the index of refraction of a transmission medium.
Imaging Interferometric Microscopy
US Patent:
2009005, Feb 26, 2009
Filed:
May 8, 2008
Appl. No.:
12/117334
Inventors:
Steven R. J. BRUECK - Albuquerque NM, US
Alexander Neumann - Albuquerque NM, US
Yuliya V. Kuznetsova - Albuquerque NM, US
Alexander Neumann - Albuquerque NM, US
Yuliya V. Kuznetsova - Albuquerque NM, US
International Classification:
G02B 21/06
US Classification:
359370
Abstract:
Exemplary embodiments provide an image interferometric microscope (IIM) and methods for image interferometric microscopy. The disclosed IIM can approach the linear systems limits of optical resolution by using a plurality of off-axis illuminations to access high spatial frequencies along with interferometric reintroduction of a zero-order reference beam on the low-NA side of the optical system. In some embodiments, a thin object can be placed normal to the optical axis and the frequency space limit can be extended to about [(1+NA)n/λ], where NA is the numerical-aperture of the objective lens used, n is the refraction index of the transmission medium and A is an optical wavelength. In other embodiments, tilting the object plane can further allow collection of diffraction information up to the material transmission bandpass limited spatial frequency of about 2n/λ.
Structural Illumination And Evanescent Coupling For The Extension Of Imaging Interfermetric Microscopy
US Patent:
8526105, Sep 3, 2013
Filed:
Jan 6, 2012
Appl. No.:
13/345267
Inventors:
Steven R. J. Brueck - Alburquerque NM, US
Yuliya Kuznetsova - Albuquerque NM, US
Alexander Neumann - Albuquerque NM, US
Yuliya Kuznetsova - Albuquerque NM, US
Alexander Neumann - Albuquerque NM, US
Assignee:
STC.UNM - Albuquerque NM
International Classification:
G02B 21/06, G02B 21/00
US Classification:
359385, 359368
Abstract:
In accordance with the invention, there are imaging interferometric microscopes and methods for imaging interferometric microscopy using structural illumination and evanescent coupling for the extension of imaging interferometric microscopy. Furthermore, there are coherent anti-Stokes Raman (CARS) microscopes and methods for coherent anti-Stokes Raman (CARS) microscopy, wherein imaging interferometric microscopy techniques are applied to get material dependent spectroscopic information.
Imaging Interferometric Microscopy
US Patent:
8203782, Jun 19, 2012
Filed:
Apr 14, 2011
Appl. No.:
13/087297
Inventors:
Steven R. J. Brueck - Albuquerque NM, US
Alexander Neumann - Albuquerque NM, US
Yuliya V. Kuznetsova - Albuquerque NM, US
Alexander Neumann - Albuquerque NM, US
Yuliya V. Kuznetsova - Albuquerque NM, US
Assignee:
STC.UNM - Albuquerque NM
International Classification:
G02B 21/00
US Classification:
359370
Abstract:
Exemplary embodiments provide an image interferometric microscope (IIM) and methods for image interferometric microscopy. The disclosed IIM can approach the linear systems limits of optical resolution by using a plurality of off-axis illuminations to access high spatial frequencies along with interferometric reintroduction of a zero-order reference beam on the low-NA side of the optical system. In some embodiments, a thin object can be placed normal to the optical axis and the frequency space limit can be extended to about [(1+NA)n/λ], where NA is the numerical-aperture of the objective lens used, n is the refraction index of the transmission medium and λ is an optical wavelength. In other embodiments, tilting the object plane can further allow collection of diffraction information up to the material transmission bandpass limited spatial frequency of about 2n/λ.