ALAN B SMITH
Broker in Lincoln Center, MA
License number
Massachusetts 94666
Issued Date
Nov 1, 1976
Expiration Date
Jul 28, 1987
Type
Broker
Address
Address
Lincoln Center, MA 01773
Personal information
See more information about ALAN B SMITH at radaris.comName
Address
Phone
50 Edgewood Ave, Haverhill, MA 01832
40 Fuller Brook Ave, Needham, MA 02492
222 Buck Island Rd, West Yarmouth, MA 02673
67 South St, South Yarmouth, MA 02664
Professional information
Electrical Guide For Tight Tolerance Machining
US Patent:
5023991, Jun 18, 1991
Filed:
Aug 31, 1988
Appl. No.:
7/238868
Inventors:
Alan B. Smith - Lincoln MA
Assignee:
Digital Equipment Corporation - Maynard MA
International Classification:
G11B 5127, B23Q 1700, B23Q 1500
US Classification:
29603
Abstract:
Method and apparatus for determining present machining height during machining of a workpiece includes an analog resistive sensor, a discrete resistive sensor and a resistive integrity sensor. Analog sensor preferably has a plurality of resistive elements. Discrete sensor includes contact break points on resistive legs, each leg having a different resistive value to create a step-wise incremental change in resistance of discrete sensor as contacts are lapped away. Integrity sensor has resistive value in fixed relation to resistive value of discrete sensor such that ratio is indicative of integrity before machining. Invention enables use of electronic lapping guide with electrically conductive lap without shorting out. Discrete sensor value used to determine location of rear plane of analog sensor and analog sensor value used to confirm identity of break point as part of method for determining current lapping height. Formulae disclosed enable computation of lapping height from measured resistances based on a known height of the analog sensor prior to lapping.
Electrical Guide For Tight Tolerance Machining
US Patent:
5175938, Jan 5, 1993
Filed:
May 17, 1991
Appl. No.:
7/694802
Inventors:
Alan B. Smith - Lincoln MA
Assignee:
Digital Equipment Corporation - Maynard MA
International Classification:
G01B 330, G11B 5127, B23Q 1720
US Classification:
33567
Abstract:
Method and apparatus for determining present machining height during machining of a workpiece includes an analog resistive sensor, a discrete resistive sensor and a resistive integrity sensor. Analog sensor preferably has a plurality of resistive elements. Discrete sensor includes contact break points on resistive legs, each leg having a different resistive value to create a step-wise incremental change in resistance of discrete sensor as contacts are lapped away. Integrity sensor has resistive value in fixed relation to resistive value of discrete sensor such that ratio is indicative of integrity before machining. Invention enables use of electronic lapping guide with electrically conductive lap without shorting out. Discrete sensor value used to determine location of rear plane of analog sensor and analog sensor value used to confirm identity of break point as part of method for determining current lapping height. Formulae disclosed enable computation of lapping height from measured resistances based on a known height of the analog sensor prior to lapping.
Electrical Access For Electrical Lapping Guides
US Patent:
5494473, Feb 27, 1996
Filed:
Jul 7, 1993
Appl. No.:
8/089141
Inventors:
David J. Dupuis - Westminster MA
David J. Kindler - Concord MA
Alan B. Smith - Lincoln MA
David J. Kindler - Concord MA
Alan B. Smith - Lincoln MA
Assignee:
Quantum Corporation - Milpitas CA
International Classification:
B24B 4900, B24B 5100
US Classification:
451 1
Abstract:
The invention provides a new method and apparatus for electrically accessing a lapping sensor positioned along a row of slider sites on a wafer. The apparatus for accessing the lapping sensor may be positioned outside of the boundaries of the slider sites. The apparatus may also provide top conductors electrically connecting target pads to contact pads. The process for lapping rows of slider sites includes coupling a measurement device to a target pad, coupling a lapping sensor to the top conductor, and lapping the row until the measurement device detects a predetermined signal from the lapping sensor.
Permanet Magnet Easy-Axis Biased Magnetoresistive Head
US Patent:
5193039, Mar 9, 1993
Filed:
Apr 17, 1991
Appl. No.:
7/686596
Inventors:
Alan B. Smith - Lincoln MA
Michael Mallary - Berlin MA
Michael Mallary - Berlin MA
Assignee:
Digital Equipment Corporation - Maynard MA
International Classification:
G11B 539
US Classification:
360113
Abstract:
Method and apparatus for supplying bias to a magnetoresistive element in an encapsulated thin film head for reducing the likelihood of generation of Barkhausen noise when reading flux from a magnetic storage disk. The invention achieves a relatively uniform easy axis bias field in an easy to implement manner by creating a magnetic bias structure on the encapsulated heat at the same time as providing the contact pads for the MR element.